AGENDA THIRD REVIEW MEETING IST-2001-35304 AMETIST
Material presented the meeting in Brussels, 23 November 2004
Overview of Project Frits Vandraager
Model Checker Aided Design of a Controller for a Wafer Scanner Martijn Hendriks
Uppaal: New developments Gerd Behrmann
Axxom Case Study: New developments Ed Brinksma
Exploitation and Dissemination Oded Maler
WP1: Modelling Oded Maler
WP3: Case studies Ed Brinksma